MCF5407CAI220 Freescale Semiconductor, MCF5407CAI220 Datasheet - Page 64
![IC MPU 32B 220MHZ COLDF 208-FQFP](/photos/12/22/122277/mcf5407cai220_sml.jpg)
MCF5407CAI220
Manufacturer Part Number
MCF5407CAI220
Description
IC MPU 32B 220MHZ COLDF 208-FQFP
Manufacturer
Freescale Semiconductor
Series
MCF540xr
Specifications of MCF5407CAI220
Core Processor
Coldfire V4
Core Size
32-Bit
Speed
220MHz
Connectivity
EBI/EMI, I²C, UART/USART
Peripherals
DMA, WDT
Number Of I /o
16
Program Memory Type
ROMless
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
1.65 V ~ 3.6 V
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
208-FQFP
Processor Series
MCF540x
Core
ColdFire V4
Data Bus Width
32 bit
Program Memory Size
8 KB
Data Ram Size
4 KB
Maximum Clock Frequency
162 MHz
Number Of Programmable I/os
16
Operating Supply Voltage
1.8 V to 3.3 V
Mounting Style
SMD/SMT
3rd Party Development Tools
JLINK-CF-BDM26, EWCF
Cpu Speed
220MHz
Embedded Interface Type
I2C, UART
Digital Ic Case Style
FQFP
No. Of Pins
208
Supply Voltage Range
3.3V
Rohs Compliant
Yes
For Use With
M5407C3 - KIT EVAL FOR MCF5407 W/ETHERNET
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Program Memory Size
-
Data Converters
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MCF5407CAI220
Manufacturer:
Freescale
Quantity:
789
Company:
Part Number:
MCF5407CAI220
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
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Suggested Reading
The following literature may be helpful with respect to the topics in Part I:
Acronyms and Abbreviations
Table I-i contains acronyms and abbreviations are used in Part I.
I-xx
ADC
ALU
BDM
BIST
BSDL
CODEC
DAC
DMA
DSP
EA
EDO
FIFO
GPIO
I
IEEE
IFP
IPL
JEDEC
JTAG
LIFO
2
• Chapter 5, “Debug Support,” describes the Revision C enhanced hardware debug
• ColdFire Programmers Reference Manual, R1.0 (MCF5200PRM/AD)
• Using Microprocessors and Microcomputers: The Motorola Family, William C.
C
Term
support in the MCF5407. This revision of the ColdFire debug architecture
encompasses earlier revisions.
Wray, Ross Bannatyne, Joseph D. Greenfield
Analog-to-digital conversion
Arithmetic logic unit
Background debug mode
Built-in self test
Boundary-scan description language
Code/decode
Digital-to-analog conversion
Direct memory access
Digital signal processing
Effective address
Extended data output (DRAM)
First-in, first-out
General-purpose I/O
Inter-integrated circuit
Institute for Electrical and Electronics Engineers
Instruction fetch pipeline
Interrupt priority level
Joint Electron Device Engineering Council
Joint Test Action Group
Last-in, first-out
Table I-i. Acronyms and Abbreviated Terms
MCF5407 User’s Manual
Meaning
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