mcf5307cft90b Freescale Semiconductor, Inc, mcf5307cft90b Datasheet - Page 350

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mcf5307cft90b

Manufacturer Part Number
mcf5307cft90b
Description
Mcf5307 Coldfire Integrated Microprocessor User
Manufacturer
Freescale Semiconductor, Inc
Datasheet
Suggested Reading
The following literature may be helpful with respect to the topics in Part IV:
Acronyms and Abbreviations
Table IV-i describes acronyms and abbreviations used in Part IV.
IV-ii
BDM
BIST
BSDL
DMA
DSP
EDO
GPIO
I
IEEE
IPL
JEDEC
JTAG
LSB
lsb
MAC
MBAR
MSB
msb
Mux
PCLK
PLL
POR
PQFP
2
• IEEE Standard Test Access Port and Boundary-Scan Architecture
• IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture
C
Term
(1149.1)
Background debug mode
Built-in self test
Boundary-scan description language
Direct memory access
Digital signal processing
Extended data output (DRAM)
Inter-integrated circuit
Institute for Electrical and Electronics Engineers
Interrupt priority level
Joint Electron Device Engineering Council
Joint Test Action Group
Least-significant byte
Least-significant bit
Multiple accumulate unit
Memory base address register
Most-significant byte
Most-significant bit
Multiplex
Processor clock
Phase-locked loop
Power-on reset
Plastic quad flat pack
Table IV-i. Acronyms and Abbreviated Terms
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
MCF5307 User’s Manual
Meaning

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