MPC8543VTANGA Freescale Semiconductor, MPC8543VTANGA Datasheet - Page 90

• Manufacturer Part Number: MPC8543VTANGA
• Description: Microprocessors - MPU PQ3 8543
• Manufacturer: Freescale Semiconductor

Specifications of MPC8543VTANGA

• Product Category: Microprocessors - MPU
• Rohs: yes
• Processor Series: PowerQUICC III
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 800 MHz
• Maximum Operating Temperature: + 105 C
• Mounting Style: SMD/SMT
• Package / Case: BGA
• I/o Voltage: 1.8 V, 2.5 V, 3.3 V
• Minimum Operating Temperature: 0 C

Serial RapidIO
802.3ae-2002 is specified as the test pattern for use in eye pattern and jitter measurements. Annex 48B of
IEEE Std. 802.3ae-2002 is recommended as a reference for additional information on jitter test methods.
18.9.1
For the purpose of eye template measurements, the effects of a single-pole high pass filter with a 3 dB point
at (baud frequency)/1667 is applied to the jitter. The data pattern for template measurements is the
continuous jitter test pattern (CJPAT) defined in Annex 48A of IEEE 802.3ae. All lanes of the LP-serial
link shall be active in both the transmit and receive directions, and opposite ends of the links shall use
asynchronous clocks. Four lane implementations shall use CJPAT as defined in Annex 48A. Single lane
implementations shall use the CJPAT sequence specified in Annex 48A for transmission on lane 0. The
amount of data represented in the eye shall be adequate to ensure that the bit error ratio is less than 10
The eye pattern shall be measured with AC coupling and the compliance template centered at 0 V
differential. The left and right edges of the template shall be aligned with the mean zero crossing points of
the measured data eye. The load for this test shall be 100- resistive ± 5% differential to 2.5 GHz.
18.9.2
For the purpose of jitter measurement, the effects of a single-pole high pass filter with a 3 dB point at (baud
frequency)/1667 is applied to the jitter. The data pattern for jitter measurements is the
pattern (CJPAT) pattern defined in Annex 48A of IEEE 802.3ae. All lanes of the LP-serial link shall be
active in both the transmit and receive directions, and opposite ends of the links shall use asynchronous
clocks. Four lane implementations shall use CJPAT as defined in Annex 48A. Single lane implementations
shall use the CJPAT sequence specified in Annex 48A for transmission on lane 0. Jitter shall be measured
with AC coupling and at 0 V differential. Jitter measurement for the transmitter (or for calibration of a jitter
tolerance setup) shall be performed with a test procedure resulting in a BER curve such as that described
in Annex 48B of IEEE 802.3ae.
18.9.3
Transmit jitter is measured at the driver output when terminated into a load of 100  resistive ± 5%
differential to 2.5 GHz.
18.9.4
Jitter tolerance is measured at the receiver using a jitter tolerance test signal. This signal is obtained by first
producing the sum of deterministic and random jitter defined in
and then adjusting the signal amplitude until the data eye contacts the 6 points of the minimum eye opening
of the receive template shown in
have vertical waveform symmetry about the average value and have horizontal symmetry (including jitter)
about the mean zero crossing. Eye template measurement requirements are as defined above. Random
jitter is calibrated using a high pass filter with a low frequency corner at 20 MHz and a 20 dB/decade
roll-off below this. The required sinusoidal jitter specified in
then added to the signal and the test load is replaced by the receiver being tested.
90
Eye Template Measurements
Jitter Test Measurements
Transmit Jitter
Jitter Tolerance
MPC8548E PowerQUICC III Integrated Processor Hardware Specifications, Rev. 9
Figure 54
and
Table
69. Note that for this to occur, the test signal must
Section 18.7, “Receiver Specifications,”
Section 18.7, “Receiver Specifications,”
Freescale Semiconductor
Continuous Jit
ter test
–12
is
.