EP2SGX90EF1152C4N Altera, EP2SGX90EF1152C4N Datasheet - Page 157

• Manufacturer Part Number: EP2SGX90EF1152C4N
• Description: IC STRATIX II GX 90K 1152-FBGA
• Manufacturer: Altera
• Series: Stratix® II GXr

Specifications of EP2SGX90EF1152C4N

• Number Of Logic Elements/cells: 90960
• Number Of Labs/clbs: 4548
• Total Ram Bits: 4520448
• Number Of I /o: 558
• Voltage - Supply: 1.15 V ~ 1.25 V
• Mounting Type: Surface Mount
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 1152-FBGA
• Family Name: Stratix II GX
• Number Of Logic Blocks/elements: 90960
• # I/os (max): 558
• Frequency (max): 732.1MHz
• Process Technology: SRAM
• Operating Supply Voltage (typ): 1.2V
• Logic Cells: 90960
• Ram Bits: 4520448
• Operating Supply Voltage (min): 1.15V
• Operating Supply Voltage (max): 1.25V
• Operating Temp Range: 0C to 85C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 1152
• Package Type: FC-FBGA
• For Use With: 544-1725 - PCIE KIT W/S II GX EP2SGX90N544-1724 - SI KIT W/SII GX EP2SGX90N544-1702 - VIDEO KIT W/SII GX EP2SGX90N
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Number Of Gates: -
• Lead Free Status / Rohs Status: Compliant
• Other names: 544-1767; EP2SGX90EF35C4NES

IEEE Std. 1149.1
JTAG Boundary-
Scan Support
Altera Corporation
October 2007
SIIGX51005-1.4
All Stratix
boundary-scan test (BST) circuitry that complies with the IEEE
Std. 1149.1. You can perform JTAG boundary-scan testing either before or
after, but not during configuration. Stratix II GX devices can also use the
JTAG port for configuration with the Quartus
using either Jam Files (.jam) or Jam Byte-Code Files (.jbc).
Stratix II GX devices support IOE I/O standard setting reconfiguration
through the JTAG BST chain. The JTAG chain can update the I/O
standard for all input and output pins any time before or during user
mode through the CONFIG_IO instruction. You can use this capability for
JTAG testing before configuration when some of the Stratix II GX pins
drive or receive from other devices on the board using voltage-referenced
standards. Since the Stratix II GX device may not be configured before
JTAG testing, the I/O pins may not be configured for appropriate
electrical standards for chip-to-chip communication. Programming these
I/O standards via JTAG allows you to fully test I/O connections to other
devices.
A device operating in JTAG mode uses four required pins, TDI, TDO, TMS,
and TCK, and one optional pin, TRST. The TCK pin has an internal weak
pull-down resistor, while the TDI, TMS, and TRST pins have weak
internal pull-up resistors. The JTAG input pins are powered by the 3.3-V
VCCPD pins. The TDO output pin is powered by the VCCIO power supply
in I/O bank 4.
Stratix II GX devices also use the JTAG port to monitor the logic operation
of the device with the SignalTap
Stratix II GX devices support the JTAG instructions shown in
1
Stratix II GX devices must be within the first eight devices in a
JTAG chain. All of these devices have the same JTAG controller.
If any of the Stratix II GX devices appear after the eighth device
in the JTAG chain, they will fail configuration. This does not
affect SignalTap II embedded logic analysis.
®
II GX devices provide Joint Test Action Group (JTAG)
3. Configuration & Testing
®
II embedded logic analyzer.
®
II software or hardware
Table
3–1.
3–1