HD64F2239TF20I Renesas Electronics America, HD64F2239TF20I Datasheet - Page 940

MCU 3V 384K I-TEMP 100-TQFP

HD64F2239TF20I

Manufacturer Part Number
HD64F2239TF20I
Description
MCU 3V 384K I-TEMP 100-TQFP
Manufacturer
Renesas Electronics America
Series
H8® H8S/2200r
Datasheet

Specifications of HD64F2239TF20I

Core Processor
H8S/2000
Core Size
16-Bit
Speed
20MHz
Connectivity
I²C, SCI, SmartCard
Peripherals
DMA, POR, PWM, WDT
Number Of I /o
72
Program Memory Size
384KB (384K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
100-TQFP, 100-VQFP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
HD64F2239TF20I
Manufacturer:
Renesas Electronics America
Quantity:
10 000
Section 27 Electrical Characteristics
Item
Read data
access time 2
Read data
access time 3
Read data
access time 4
Read data
access time 5
WR delay time 1 t
WR delay time 2 t
WR pulse width
1
WR pulse width
2
Write data delay
time
Write data setup
time
Write data hold
time
WAIT setup time t
WAIT hold time
BREQ
setup time
BACK delay time t
Bus-floating time t
Rev. 6.00 Mar. 18, 2010 Page 878 of 982
REJ09B0054-0600
Symbol
t
t
t
t
t
t
t
t
t
t
t
ACC2
ACC3
ACC4
ACC5
WRD1
WRD2
WSW1
WSW2
WDD
WDS
WDH
WTS
WTH
BRQS
BACD
BZD
Min
1.0 × t
− 20
1.5 × t
− 20
0.5 × t
− 57
0.5 × t
− 27
40
10
40
Condition A
cyc
cyc
cyc
cyc
Max
1.5 × t
− 50
2.0 × t
− 55
2.5 × t
− 50
3.0 × t
− 55
40
40
60
40
60
cyc
cyc
cyc
cyc
Min
1.0 × t
− 60
1.5 × t
− 60
0.5 × t
− 80
0.5 × t
− 60
90
10
90
Condition B
cyc
cyc
cyc
cyc
Max
1.5 × t
− 90
2.0 × t
− 90
2.5 × t
− 90
3.0 × t
− 90
90
90
100
90
160
cyc
cyc
cyc
cyc
Min
1.0 × t
− 20
1.5 × t
− 20
0.5 × t
− 65
0.5 × t
− 20
25
10
25
Condition C
cyc
cyc
cyc
cyc
Max
1.5 × t
− 40
2.0 × t
− 50
2.5 × t
− 40
3.0 × t
− 50
25
25
40
40
50
cyc
cyc
cyc
cyc
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Test
Conditions
Figures
27.14 to
27.18
Figure
27.16
Figure
27.19

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