SAM9RL64 Atmel Corporation, SAM9RL64 Datasheet - Page 234

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SAM9RL64

Manufacturer Part Number
SAM9RL64
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM9RL64

Flash (kbytes)
0 Kbytes
Pin Count
217
Max. Operating Frequency
240 MHz
Cpu
ARM926
Hardware Qtouch Acquisition
No
Max I/o Pins
118
Ext Interrupts
118
Usb Transceiver
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
1
Twi (i2c)
2
Uart
5
Ssc
2
Sd / Emmc
1
Graphic Lcd
Yes
Video Decoder
No
Camera Interface
No
Adc Channels
6
Adc Resolution (bits)
10
Adc Speed (ksps)
220
Resistive Touch Screen
Yes
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
64
Self Program Memory
NO
External Bus Interface
1
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.08 to 1.32
Fpu
No
Mpu / Mmu
No / Yes
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
Debug in Depth
B.6.5
B-16
Scan chains 0, 1, 2, and 3
TAPSM[3:0], TCK1, and TCK2.The list of scan chain numbers allocated by ARM are
shown in Table B-2 on page B-16. An external scan chain can take any other
number.The serial data stream to be applied to the external scan chain is made present
on SDINBS, the serial data back from the scan chain must be presented to the TAP
controller on the SDOUTBS input. The scan chain present between SDINBS and
SDOUTBS is connected between TDI and TDO whenever scan chain 3 is selected, or
when any of the unassigned scan chain numbers is selected. If there is more than one
external scan chain, a multiplexor must be built externally to apply the desired scan
chain output to SDOUTBS. The multiplexor can be controlled by decoding
SCREG[3:0].
Table B-2 lists the scan chain number allocation.
These enable serial access to the core logic and to EmbeddedICE Logic for
programming purposes. They are described in detail below.
Scan chain 0 and 1
Purpose
Length
Each scan chain cell is fairly simple and consists of a serial register and a multiplexor
as shown in Figure B-4 on page B-17. The scan cells perform two basic functions:
CAPTURE
Copyright © 1994-2001. All rights reserved.
Enables access to the processor core for test and debug.
Scan chain 0: 105 bits. Scan chain 1: 33 bits
Table B-2 Scan chain number allocation
Scan chain
number
0
1
2
3
4
8
a
a. To be implemented by ASIC designer.
Function
Macrocell scan test
Debug
EmbeddedICE Logic
programming
External boundary-scan
Reserved
Reserved
ARM DDI 0029G

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