SAM9RL64 Atmel Corporation, SAM9RL64 Datasheet - Page 245

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SAM9RL64

Manufacturer Part Number
SAM9RL64
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM9RL64

Flash (kbytes)
0 Kbytes
Pin Count
217
Max. Operating Frequency
240 MHz
Cpu
ARM926
Hardware Qtouch Acquisition
No
Max I/o Pins
118
Ext Interrupts
118
Usb Transceiver
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
1
Twi (i2c)
2
Uart
5
Ssc
2
Sd / Emmc
1
Graphic Lcd
Yes
Video Decoder
No
Camera Interface
No
Adc Channels
6
Adc Resolution (bits)
10
Adc Speed (ksps)
220
Resistive Touch Screen
Yes
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
64
Self Program Memory
NO
External Bus Interface
1
Dram Memory
sdram
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.08 to 1.32
Fpu
No
Mpu / Mmu
No / Yes
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
Debug in Depth
Bit 33 of scan chain 1 is used to force the ARM7TDMI core to resynchronize back to
MCLK. The penultimate instruction of the debug sequence is scanned in with bit 33 set
HIGH. The final instruction of the debug sequence is the branch and this is scanned in
with bit 33 LOW. The core is then clocked to load the branch into the pipeline. Now, the
RESTART instruction is selected in the TAP controller. When the state machine enters
the RUN-TEST-IDLE state, the scan chain reverts back to system mode and clock
resynchronization to MCLK occurs in the core. The ARM7TDMI core then resumes
normal operation, fetching instructions from memory. The delay, until the state machine
is in the RUN-TEST-IDLE state, enables conditions to be set up in other devices in a
multiprocessor system without taking immediate effect. Then, when the
RUN-TEST-IDLE state is entered, all processors resume operation simultaneously.
The function of DBGACK is to tell the rest of the system when the core is in debug
state. This can be used to inhibit peripherals such as watchdog timers that have real time
characteristics. Also, DBGACK can be used to mask out memory accesses which are
caused by the debugging process. For example, when the core enters debug state after a
breakpoint, the instruction pipeline contains the breakpointed instruction plus two other
instructions that have been prefetched. On entry to debug state, the pipeline is flushed.
Therefore, on exit from debug state, the pipeline must be refilled to its previous state.
Because of the debugging process, more memory accesses occur than is normally
expected. Any system peripheral that is sensitive to the number of memory accesses can
be inhibited by using DBGACK.
For example, imagine a fictitious peripheral that simply counts the number of memory
cycles. This device must return the same answer after a program has been run both with
and without debugging. Figure B-6 on page B-28 shows the behavior of the core on exit
from the debug state.
ARM DDI 0029G
Copyright © 1994-2001. All rights reserved.
B-27

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