mpc823rg Freescale Semiconductor, Inc, mpc823rg Datasheet - Page 1116

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mpc823rg

Manufacturer Part Number
mpc823rg
Description
Mpc823 Powerquicc Integrated Communications Processor For Portable Systems
Manufacturer
Freescale Semiconductor, Inc
Datasheet
SECTION 21
IEEE 1149.1 TEST ACCESS PORT
The MPC823 provides a dedicated user-accessible test access port (TAP) that is fully
compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan
Architecture . Problems associated with testing high-density circuit boards have led tothe
development of this proposed standard under the sponsorship of the Test Technology
Committee of IEEE and the Joint Test Action Group (JTAG). The MPC823 implementation
supports circuit board test strategies based on this standard.
The TAP consists of five dedicated signal pins, a 16-state TAP controller, and two test data
registers. A boundary scan register links all the device signal pins into a single shift register.
The test logic, which is implemented using static logic design, is independent of the device
system logic. The MPC823 implementation provides the capability to:
• Perform boundary scan operations to check circuit board electrical continuity.
• Bypass the MPC823 for a given circuit board test by effectively reducing the boundary
• Sample the MPC823 system pins during operation and transparently shift out the result
• Disable the output drive to pins during circuit board testing.
scan register to a single cell.
in the boundary scan register.
Note: Certain precautions must be observed to ensure that the IEEE 1149.1-like test
logic does not interfere with nontest operation.
Freescale Semiconductor, Inc.
For More Information On This Product,
MPC823 REFERENCE MANUAL
Go to: www.freescale.com
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