MC9S12G FREESCALE [Freescale Semiconductor, Inc], MC9S12G Datasheet - Page 1108

• Manufacturer Part Number: MC9S12G
• Description: Ignores external trigger. Performs one conversion sequence and stops.
• Manufacturer: FREESCALE [Freescale Semiconductor, Inc]

Electrical Characteristics
1
2
3
4
A.6.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The data retention and program/erase cycling failure rates are specified at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
1108
Num C
12a
12b
10
11
Typical program and erase times are based on typical f
Maximum program and erase times are based on minimum f
t
Typical value for a new device
8
9
cyc
This document is valid for the S12G96 and the S12G128 device. All information related to other devices is preliminary.
= 1 / f
D P-Flash sector erase time
D P-Flash phrase programming time
D EEPROM sector erase time
D EEPROM erase verify (blank check) time
D EEPROM one word programming time
D EEPROM two word programming time
(FTMRG240K2, TMRG192K2)
EEPROM erase verify (blank check) time
(FTMRG128K1, FTMRG96K1)
EEPROM erase verify (blank check) time
(FTMRG64K1, FTMRG48K1)
EEPROM erase verify (blank check) time
(FTMRG32K1, FTMRG16K1)
NVMBUS
NVM Reliability Parameters
Rating
MC9S12G Family Reference Manual,
NVMOP
NVMOP
and maximum f
and maximum f
Symbol
t
t
t
t
t
t
t
dcheck
dcheck
dcheck
dcheck
dpgm1
dpgm2
t
t
ppgm
pera
dera
Rev.1.01
NVMBUS
Min
NVMBUS
—
—
—
—
—
—
—
—
—
Typ
185
140
20
97
5
—
—
—
—
4
1
Freescale Semiconductor
Max
2620
2620
1540
1030
200
106
154
26
26
2
Unit
t
t
t
t
ms
ms
µs
µs
µs
cyc
cyc
cyc
cyc
3