UPSD3234A-40U6T STMicroelectronics, UPSD3234A-40U6T Datasheet - Page 159

• Manufacturer Part Number: UPSD3234A-40U6T
• Description: IC MCU 8032 64KB FLASH 80TQFP
• Manufacturer: STMicroelectronics
• Series: µPSDr

Specifications of UPSD3234A-40U6T

• Core Processor: 8032
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, UART/USART, USB
• Peripherals: LVR, POR, PWM, WDT
• Number Of I /o: 46
• Program Memory Size: 288KB (288K x 8)
• Program Memory Type: FLASH
• Ram Size: 8K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 4x8b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 80-TQFP, 80-VQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -

UPSD3234A, UPSD3234BV, UPSD3233B, UPSD3233BV
31
31.1
31.1.1
31.1.2
31.2
31.2.1
31.2.2
EMC characteristics
Susceptibility test are performed on a sample basis during product characterization.
Functional EMS (electromagnetic susceptibility)
Based on a simple running application on the product (toggling 2 LEDs through I/O ports),
the product is stressed by two electromagnetic events until a failure occurs (indicated by the
LEDs).
ESD
Electro-Static Discharge (positive and negative) is applied on all pins of the device until a
functional disturbance occurs. This test conforms with the IEC 1000-4-2 Standard.
FTB
A burst of Fast Transient voltage (positive and negative) is applied to V
100pF capacitor, until a functional disturbance occurs. This test conforms with the IEC
1000-4-2 Standard.
A device reset allows normal operations to be resumed. The test results are given in
Table
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore, it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for the user’s application.
Software recommendations
The software flowchart must include the management of ‘runaway’ conditions, such as:
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Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the RESET pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see Application Note AN1015).
Corrupted program counter
Unexpected reset
Critical data corruption (e.g., control registers)
110, based on the EMS levels and classes defined in Application Note AN1709.
DD
EMC characteristics
and V
SS
through a
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