DF2218BR24V Renesas Electronics America, DF2218BR24V Datasheet - Page 507
![IC H8S/2218 MCU FLASH 112-LFBGA](/photos/12/42/124228/df2218br24v_sml.jpg)
DF2218BR24V
Manufacturer Part Number
DF2218BR24V
Description
IC H8S/2218 MCU FLASH 112-LFBGA
Manufacturer
Renesas Electronics America
Series
H8® H8S/2200r
Specifications of DF2218BR24V
Core Processor
H8S/2000
Core Size
16-Bit
Speed
24MHz
Connectivity
SCI, SmartCard, USB
Peripherals
DMA, POR, PWM, WDT
Number Of I /o
69
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
12K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 6x10b
Oscillator Type
External
Operating Temperature
-20°C ~ 75°C
Package / Case
112-LFBGA
For Use With
HS0005KCU11H - EMULATOR E10A-USB H8S(X),SH2(A)3DK2218-SS - KIT DEV H8S/2218 WINDOWS SIDESHW3DK2218 - DEV EVAL KIT H8S/2218
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
DF2218BR24V
Manufacturer:
Renesas Electronics America
Quantity:
10 000
- Current page: 507 of 758
- Download datasheet (5Mb)
13.2
Table 13.1 shows the I/O pins used in the boundary scan function.
Table 13.1 Pin Configuration
Pin Name
TMS
TCK
TDI
TDO
TRST
Pin Configuration
I/O
Input
Input
Input
Output
Input
Function
Test Mode Select
Controls the TAP controller which is a 16-state Finite State
Machine.
The TMS input value at the rising edge of TCK determines the
status transition direction on the TAP controller.
The TMS is fixed high when the boundary scan function is not
used.
The protocol is based on JTAG standard (IEEE Std.1149.1).
This pin has a pull-up resistor.
Test Clock
A clock signal for the boundary scan function.
When the boundary scan function is used, input a clock of
50% duty to this pin.
This pin has a pull-up resistor.
Test Data Input
A data input signal for the boundary scan function.
Data input from the TDI is latched at the rising edge of TCK.
TDI is fixed high when the boundary scan function is not used.
This pin has a pull-up register.
Test Data Output
A data output signal for the boundary scan function. Data
output from the TDO changes at the falling edge of TCK. The
output driver of the TDO is driven only when it is necessary
only in Shift-IR or Shift-DR states, and is brought to the high-
impedance state when not necessary.
Test Reset
Asynchronously resets the TAP controller when TRST is
brought low.
The user must apply power-on reset signal specific to the
boundary scan function when the power is supplied. (For
details on signal design, refer to section 13.5, Usage Notes.)
This pin has a pull-up resister.
Rev.7.00 Dec. 24, 2008 Page 451 of 698
REJ09B0074-0700
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