SC2200 NSC [National Semiconductor], SC2200 Datasheet - Page 78

• Manufacturer Part Number: SC2200
• Description: Thin Client On a Chip
• Manufacturer: NSC [National Semiconductor]

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Signal Definitions
2.4.19 Test and Measurement Interface Signals
Signal Name
PLL6B
PLL5B
PLL2B
GXCLK
TEST3
TEST2
TEST1
TEST0
GTEST
SDTEST5
SDTEST4
SDTEST3
SDTEST2
SDTEST1
SDTEST0
TDP
TDN
EBGA
AL16
AL16
AH3
AG4
AH4
AH5
C28
B29
D28
B29
C28
D28
AL5
AL3
AJ2
AJ4
AJ1
(Continued)
Ball No.
TEPBGA
AG4
AH3
AG4
AH3
V30
D28
C31
C28
C30
D30
D31
AJ1
V30
AJ1
F30
E28
B29
Type
I/O
I/O
I/O
I/O
I/O
O
O
O
O
O
O
O
O
O
O
O
I
Description
PLL6, PLL5 and PLL2 Bypass. These sig-
nals are used for internal testing only. For
normal operation leave unconnected.
GX Clock. This signal is for internal testing
only. For normal operation either program as
FP_VDD_ON or leave unconnected.
Internal Test Signals. These signals are
used for internal testing only. For normal
operation, leave unconnected unless pro-
grammed as one of their muxed options.
Global Test. This signal is used for internal
testing only. For normal operation this signal
should be pulled down with 1.5 K .
Memory Internal Test Signals. These sig-
nals are used for internal testing only. For
normal operation, these signals should be
programmed as one of their muxed options.
Thermal Diode Positive / Negative. These
signals are for internal testing only. For nor-
mal operation leave unconnected.
78
GPIO9+DCD2#+
DTR2#/BOUT2+
GPIO10+DSR2#
GPIO8+CTS2#+
GPIO7+RTS2#+
FP_VDD_ON+
FP_VDD_ON+
+IDE_IORDY1
IDE_DACK1#
IDE_DREQ1
IDE_IOW1#
IDE_IOR1#
GPIO6+
GXCLK
TEST1
TEST2
TEST0
TEST3
PLL5B
PLL6B
PLL2B
SIN2
Mux
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Revision 3.0