SAM9XE512 Atmel Corporation, SAM9XE512 Datasheet - Page 253

• Manufacturer Part Number: SAM9XE512
• Manufacturer: Atmel Corporation

Specifications of SAM9XE512

• Flash (kbytes): 512 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 180 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 96
• Ext Interrupts: 96
• Usb Transceiver: 3
• Usb Speed: Full Speed
• Usb Interface: Host, Device
• Spi: 2
• Twi (i2c): 2
• Uart: 6
• Ssc: 1
• Ethernet: 1
• Sd / Emmc: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: Yes
• Adc Channels: 4
• Adc Resolution (bits): 10
• Adc Speed (ksps): 312
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.65 to 1.95
• Fpu: No
• Mpu / Mmu: No / Yes
• Timers: 6
• Output Compare Channels: 6
• Input Capture Channels: 6
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

C.5.5
ARM DDI 0165B
Scan chains 1 and 2
The scan chain present between DBGSDIN and DBGSDOUT is connected between
DBGTDI and DBGTDO whenever scan chain 3 is selected, or when any unassigned
scan chain number is selected. If there is more than one external scan chain, a
multiplexor must be built externally to apply the desired scan chain output to
DBGSDOUT. The multiplexor can be controlled by decoding DBGSCREG[4:0].
The scan chains allow serial access to the core logic and to the EmbeddedICE hardware
for programming purposes. Each scan chain cell is simple, and comprises a serial
register and a multiplexor. A typical cell is shown in Figure C-4.
Copyright © 2000 ARM Limited. All rights reserved.
CLK
Serial data in
Table C-2 Scan chain number allocation (continued)
enable
Shift
0
1
Scan chain
number
3
4–15
16–31
Figure C-4 Typical scan chain cell
Serial data out
Test mode
Function
External boundary
scan
Reserved
Unassigned
select
0
1
Debug in depth
C-13