ATMEGA128RFA1-ZU Atmel, ATMEGA128RFA1-ZU Datasheet - Page 437

IC AVR MCU 2.4GHZ XCEIVER 64QFN

ATMEGA128RFA1-ZU

Manufacturer Part Number
ATMEGA128RFA1-ZU
Description
IC AVR MCU 2.4GHZ XCEIVER 64QFN
Manufacturer
Atmel
Series
ATMEGAr

Specifications of ATMEGA128RFA1-ZU

Frequency
2.4GHz
Data Rate - Maximum
2Mbps
Modulation Or Protocol
802.15.4 Zigbee
Applications
General Purpose
Power - Output
3.5dBm
Sensitivity
-100dBm
Voltage - Supply
1.8 V ~ 3.6 V
Current - Receiving
12.5mA
Current - Transmitting
14.5mA
Data Interface
PCB, Surface Mount
Memory Size
128kB Flash, 4kB EEPROM, 16kB RAM
Antenna Connector
PCB, Surface Mount
Operating Temperature
-40°C ~ 85°C
Package / Case
64-VFQFN, Exposed Pad
Rf Ic Case Style
QFN
No. Of Pins
64
Supply Voltage Range
1.8V To 3.6V
Operating Temperature Range
-40°C To +85°C
Svhc
No SVHC (15-Dec-2010)
Rohs Compliant
Yes
Processor Series
ATMEGA128x
Core
AVR8
Data Bus Width
8 bit
Program Memory Type
Flash
Program Memory Size
128 KB
Data Ram Size
16 KB
Interface Type
JTAG
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
38
Number Of Timers
6
Operating Supply Voltage
1.8 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWAVR, EWAVR-BL
Development Tools By Supplier
ATAVR128RFA1-EK1
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATMEGA128RFA1-ZU
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
Part Number:
ATMEGA128RFA1-ZUR
Manufacturer:
ON
Quantity:
56 000
Figure 28-1. Block Diagram
28.3 TAP - Test Access Port
8266B-MCU Wireless-03/11
TDI
TDO
TCK
TMS
CONTROLLER
M
U
X
TAP
DEVICE BOUNDARY
INSTRUCTION
BREAKPOINT
SCAN CHAIN
REGISTER
REGISTER
REGISTER
BYPASS
ID
ADDRESS
DECODER
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology,
these pins constitute the Test Access Port – TAP. These pins are:
• TMS: Test mode select. This pin is used for navigating through the TAP-controller
• TCK: Test Clock. JTAG operation is synchronous to TCK.
• TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data
• TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
The IEEE std. 1149.1 also specifies an optional TAP signal; TRST – Test ReSeT –
which is not provided.
When the JTAGEN Fuse is un-programmed, these four TAP pins are normal port pins,
and the TAP controller is in reset. When programmed the input TAP signals are
internally pulled high and the JTAG is enabled for Boundary-scan and programming.
The device is shipped with this fuse programmed.
For the on-chip debug system, in addition to the JTAG interface pins, the RESET pin is
monitored by the debugger to be able to detect external reset sources. The debugger
can also pull the RESET pin low to reset the whole system, assuming only open
collectors on the reset line are used in the application.
state machine.
Register (Scan Chains).
JTAG PROGRAMMING
MEMORY
FLASH
AND CONTROL
BREAKPOINT
OCD STATUS
INTERFACE
UNIT
Address
Data
I/O PORT 0
I/O PORT n
INTERNAL
FLOW CONTROL
CHAIN
SCAN
UNIT
BOUNDARY SCAN CHAIN
PC
Instruction
COMMUNICATION
JTAG / AVR CORE
PERIPHERAL
INTERFACE
AVR CPU
DIGITAL
UNITS
ATmega128RFA1
PERIPHERIAL
ANALOG
UNITS
Control & Clock lines
Analog inputs
437

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