ATMEGA128RFA1-ZU Atmel, ATMEGA128RFA1-ZU Datasheet - Page 442
ATMEGA128RFA1-ZU
Manufacturer Part Number
ATMEGA128RFA1-ZU
Description
IC AVR MCU 2.4GHZ XCEIVER 64QFN
Manufacturer
Atmel
Series
ATMEGAr
Datasheets
1.ATMEGA128-16AU.pdf
(385 pages)
2.ATAVR128RFA1-EK1.pdf
(13 pages)
3.ATAVR128RFA1-EK1.pdf
(555 pages)
4.ATMEGA128RFA1-ZU.pdf
(524 pages)
Specifications of ATMEGA128RFA1-ZU
Frequency
2.4GHz
Data Rate - Maximum
2Mbps
Modulation Or Protocol
802.15.4 Zigbee
Applications
General Purpose
Power - Output
3.5dBm
Sensitivity
-100dBm
Voltage - Supply
1.8 V ~ 3.6 V
Current - Receiving
12.5mA
Current - Transmitting
14.5mA
Data Interface
PCB, Surface Mount
Memory Size
128kB Flash, 4kB EEPROM, 16kB RAM
Antenna Connector
PCB, Surface Mount
Operating Temperature
-40°C ~ 85°C
Package / Case
64-VFQFN, Exposed Pad
Rf Ic Case Style
QFN
No. Of Pins
64
Supply Voltage Range
1.8V To 3.6V
Operating Temperature Range
-40°C To +85°C
Svhc
No SVHC (15-Dec-2010)
Rohs Compliant
Yes
Processor Series
ATMEGA128x
Core
AVR8
Data Bus Width
8 bit
Program Memory Type
Flash
Program Memory Size
128 KB
Data Ram Size
16 KB
Interface Type
JTAG
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
38
Number Of Timers
6
Operating Supply Voltage
1.8 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWAVR, EWAVR-BL
Development Tools By Supplier
ATAVR128RFA1-EK1
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATMEGA128RFA1-ZU
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
Company:
Part Number:
ATMEGA128RFA1-ZUR
Manufacturer:
ON
Quantity:
56 000
- ATMEGA128-16AU PDF datasheet
- ATAVR128RFA1-EK1 PDF datasheet #2
- ATAVR128RFA1-EK1 PDF datasheet #3
- ATMEGA128RFA1-ZU PDF datasheet #4
- Current page: 442 of 555
- Download datasheet (6Mb)
29 IEEE 1149.1 (JTAG) Boundary-scan
29.1 Features
29.2 System Overview
29.3 Data Registers
442
ATmega128RFA1
• JTAG (IEEE std. 1149.1 compliant) Interface
• Boundary-scan Capabilities According to the JTAG Standard
• Full Scan of all Port Functions as well as Analog Circuitry having Off-chip
• Supports the Optional IDCODE Instruction
• Additional Public AVR_RESET Instruction to Reset the ATmega128RFA1
The Boundary-scan chain has the capability of driving and observing the logic levels on
the digital I/O pins, as well as the boundary between digital and analog logic for analog
circuitry having off-chip connections. At system level, all ICs having JTAG capabilities
are connected serially by the TDI/TDO signals to form a long Shift Register. An external
controller sets up the devices to drive values at their output pins, and observe the input
values received from other devices. The controller compares the received data with the
expected result. In this way, Boundary-scan provides a mechanism for testing
interconnections and integrity of components on Printed Circuits Boards by using the
four TAP signals only.
The four IEEE 1149.1 defined mandatory JTAG instructions IDCODE, BYPASS,
SAMPLE/PRELOAD, and EXTEST, as well as the AVR specific public JTAG instruction
AVR_RESET can be used for testing the Printed Circuit Board. Initial scanning of the
Data Register path will show the ID-Code of the device, since IDCODE is the default
JTAG instruction. It may be desirable to have the AVR device in reset during test mode.
If not reset, inputs to the device may be determined by the scan operations, and the
internal software may be in an undetermined state when exiting the test mode. Entering
reset, the outputs of any port pin will instantly enter the high impedance state, making
the HIGHZ instruction redundant. If needed, the BYPASS instruction can be issued to
make the shortest possible scan chain through the device. The device can be set in the
reset state either by pulling the external RESET pin low, or issuing the AVR_RESET
instruction with appropriate setting of the Reset Data Register.
The EXTEST instruction is used for sampling external pins and loading output pins with
data. The data from the output latch will be driven out on the pins as soon as the
EXTEST
SAMPLE/PRELOAD should also be used for setting initial values to the scan ring, to
avoid damaging the board when issuing the EXTEST instruction for the first time.
SAMPLE/PRELOAD can also be used for taking a snapshot of the external pins during
normal operation of the part.
The JTAGEN Fuse must be programmed and the JTD bit in the I/O Register MCUCR
must be cleared to enable the JTAG Test Access Port.
When using the JTAG interface for Boundary-scan, using a JTAG TCK clock frequency
higher than the internal chip frequency is possible. The chip clock is not required to run.
The Data Registers relevant for Boundary-scan operations are:
• Bypass Register
• Device Identification Register
Connections
instruction
is
loaded
into
the
JTAG
IR-Register.
8266B-MCU Wireless-03/11
Therefore,
the
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