SAM3X8E Atmel Corporation, SAM3X8E Datasheet - Page 1420

• Manufacturer Part Number: SAM3X8E
• Manufacturer: Atmel Corporation

Table 45-40. Static Performance Characteristics
Note:
Table 45-41. Dynamic Performance Characteristics
Note:
45.10 AC Characteristics
45.10.1
Table 45-42. Master Clock Waveform Parameters
45.10.2
1420
Parameter
Differential Non-linearity (DNL)
Offset Error
Gain Error
Parameter
Signal to Noise Ratio - SNR
Total Harmonic Distortion - THD
Signal to Noise and Distortion - SINAD
Effective Number of Bits - ENOB
Symbol
1/(t
CPMCK
DAC Clock (F
kHz, 500 kHz] – Nyquist conditions fulfilled.
DAC Clock (F
[10 kHz, 500 kHz] – Nyquist conditions fulfilled.
)
SAM3X/A
Master Clock Characteristics
I/O Characteristics
Parameter
Master Clock Frequency
DAC
DAC
)= 50 MHz, Fs = 2 MHz, Fin = 127 kHz, IBCTL = 01, FFT using 1024 points or more, Frequency band = [10
)= 50 MHz, Fs = 2 MHz, Fin = 127 kHz, IBCTL = 01, FFT using 1024 points or more, Frequency band =
Criteria used to define the maximum frequency of the I/Os:
– output duty cycle (40%-60%)
– minimum output swing: 100 mV to VDDIO - 100 mV
Conditions
see Note
see Note
see Note
Conditions
see Note
see Note
see Note
see Note
Conditions
VDDCORE @ 1.62V
VDDCORE @ 1.8V
Min
Min
-16
-64
64
62
62
-3
-4
Min
±0.5
Typ
Typ
-71
±2
±8
71
68
68
11057A–ATARM–17-Feb-12
Max
Max
Max
78
90
+16
-80
+3
+4
74
73
73
Units
Units
Units
MHz
LSB
LSB
LSB
dB
dB
dB
dB