SAM3X8E Atmel Corporation, SAM3X8E Datasheet - Page 215

• Manufacturer Part Number: SAM3X8E
• Manufacturer: Atmel Corporation

12. Debug and Test Features
12.1
12.2
11057A–ATARM–17-Feb-12
11057A–ATARM–17-Feb-12
Description
Embedded Characteristics
The SAM3 Series Microcontrollers feature a number of complementary debug and test
capabilities. The Serial Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port
(SW-DP) and JTAG Debug (JTAG-DP) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. It also embeds a serial wire trace.
Figure 12-1. Debug and Test Block Diagram
• Debug access to all memory and registers in the system, including Cortex-M3 register bank
• Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access
• Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches
• Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and
• Instrumentation Trace Macrocell (ITM) for support of printf style debugging
• IEEE1149.1 JTAG Boundary-can on All Digital Pins
when the core is running, halted, or held in reset.
system profiling
Boundary
TAP
SWJ-DP
Reset
Test
and
POR
JTAGSEL
TDO/TRACESWO
TMS
TCK/SWCLK
TDI
TST
SAM3X/A
SAM3X/A
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