SAM4S16C Atmel Corporation, SAM4S16C Datasheet - Page 258

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SAM4S16C

Manufacturer Part Number
SAM4S16C
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM4S16C

Flash (kbytes)
1024 Kbytes
Pin Count
100
# Of Touch Channels
32
Hardware Qtouch Acquisition
No
Max I/o Pins
79
Ext Interrupts
79
Usb Transceiver
1
Quadrature Decoder Channels
2
Usb Speed
Full Speed
Usb Interface
Device
Spi
3
Twi (i2c)
2
Uart
4
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
1000
Analog Comparators
1
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
12
Temp. Sensor
Yes
Crypto Engine
No
Sram (kbytes)
128
Self Program Memory
YES
External Bus Interface
1
Dram Memory
No
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
6
Output Compare Channels
6
Input Capture Channels
6
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
12.3
12.3.1
12.3.2
258
258
Application Examples
SAM4S
SAM4S
Debug Environment
Test Environment
Figure 12-2
standard debugging functions, such as downloading code and single-stepping through the pro-
gram and viewing core and peripheral registers.
Figure 12-2. Application Debug Environment Example
Figure 12-3
and interpreted by the tester. In this example, the “board in test” is designed using a number of
JTAG-compliant devices. These devices can be connected to form a single scan chain.
shows a complete debug environment example. The SWJ-DP interface is used for
shows a test environment example (JTAG Boundary scan). Test vectors are sent
SAM4-based Application Board
Emulator/Probe
Connector
SWJ-DP
SWJ-DP
SAM4
Host Debugger
PC
11100A–ATARM–28-Oct-11
11100A–ATARM–28-Oct-11

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