SAM9G10 Atmel Corporation, SAM9G10 Datasheet - Page 577

• Manufacturer Part Number: SAM9G10
• Manufacturer: Atmel Corporation

Specifications of SAM9G10

• Flash (kbytes): 0 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 266 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 96
• Ext Interrupts: 96
• Usb Transceiver: 3
• Usb Speed: Full Speed
• Usb Interface: Host, Device
• Spi: 2
• Twi (i2c): 1
• Uart: 4
• Ssc: 3
• Sd / Emmc: 1
• Graphic Lcd: Yes
• Video Decoder: No
• Camera Interface: No
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 16
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: sdram
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.08 to 1.32
• Fpu: No
• Mpu / Mmu: No/Yes
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

Note:
11053B–ATARM–22-Sep-11
11053B–ATARM–22-Sep-11
For the Test mode, Test_SE0_NAK (see Universal Serial Bus Specification, Revision 2.0: 7.1.20, Test Mode Support). Force the
device in High Speed mode, and configure a bulk-type endpoint. Do not fill this endpoint for sending NAK to the host.
Upon command, a port’s transceiver must enter the High Speed receive mode and remain in that mode until the exit action is
taken. This enables the testing of output impedance, low level output voltage and loading characteristics. In addition, while in
this mode, upstream facing ports (and only upstream facing ports) must respond to any IN token packet with a NAK handshake
(only if the packet CRC is determined to be correct) within the normal allowed device response time. This enables testing of the
device squelch level circuitry and, additionally, provides a general purpose stimulus/response test for basic functional testing.
SAM9G35
SAM9G35
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