ATxmega128B1 Atmel Corporation, ATxmega128B1 Datasheet - Page 323
ATxmega128B1
Manufacturer Part Number
ATxmega128B1
Description
Manufacturer
Atmel Corporation
Specifications of ATxmega128B1
Flash (kbytes)
128 Kbytes
Pin Count
100
Max. Operating Frequency
32 MHz
Cpu
8-bit AVR
# Of Touch Channels
16
Hardware Qtouch Acquisition
No
Max I/o Pins
53
Ext Interrupts
53
Usb Transceiver
1
Usb Speed
Full Speed
Usb Interface
Device
Spi
3
Twi (i2c)
1
Uart
2
Segment Lcd
160
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
2000
Analog Comparators
4
Resistive Touch Screen
No
Temp. Sensor
Yes
Crypto Engine
AES/DES
Sram (kbytes)
8
Eeprom (bytes)
2048
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
Yes
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.6 to 3.6
Operating Voltage (vcc)
1.6 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
3
Output Compare Channels
10
Input Capture Channels
10
Pwm Channels
10
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
ATxmega128B1-AU
Manufacturer:
TI
Quantity:
90
Company:
Part Number:
ATxmega128B1-U
Manufacturer:
FUJITSU
Quantity:
632
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25. ADC – Analog-to-Digital Converter
25.1
25.2
8291A–AVR–10/11
Features
Overview
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The ADC converts analog signals to digital values. The ADC has 12-bit resolution and is capable
of converting up to 300 thousand samples per second (kSPS). The input selection is flexible,
and both single-ended and differential measurements can be done. For differential measure-
ments, an optional gain stage is available to increase the dynamic range. In addition, several
internal signal inputs are available. The ADC can provide both signed and unsigned results.
The ADC measurements can either be started by application software or an incoming event from
another peripheral in the device. The ADC measurements can be started with predictable timing,
and without software intervention. It is possible to use DMA to move ADC results directly to
memory or peripherals when conversions are done.
Both internal and external reference voltages can be used. An integrated temperature sensor is
available for use with the ADC. The V
the ADC.
The ADC has a compare function for accurate monitoring of user defined thresholds with mini-
mum software intervention required.
12-bit resolution
Up to 300 thousand samples per second
Differential and single-ended input
Built-in differential gain stage
Single, continuous and scan conversion options
Three internal inputs
Internal and external reference options
Compare function for accurate monitoring of user defined thresholds
Optional DMA transfer of conversion results
Optional event triggered conversion for accurate timing
Optional interrupt/event on compare result
– Down to 2.3µs conversion time with 8-bit resolution
– Down to 3.35µs conversion time with 12-bit resolution
– Up to 16 single-ended inputs
– 16x4 differential inputs without gain
– 16x4 differential input with gain
–
– Internal temperature sensor
– V
– 1.1V bandgap voltage
1/2
CC
x, 1x, 2x, 4x, 8x, 16x, 32x, and 64x gain options
voltage divided by 10
CC
/10 and the bandgap voltage can also be measured by
Atmel AVR XMEGA B
323
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