ATxmega128B1 Atmel Corporation, ATxmega128B1 Datasheet - Page 387

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ATxmega128B1

Manufacturer Part Number
ATxmega128B1
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of ATxmega128B1

Flash (kbytes)
128 Kbytes
Pin Count
100
Max. Operating Frequency
32 MHz
Cpu
8-bit AVR
# Of Touch Channels
16
Hardware Qtouch Acquisition
No
Max I/o Pins
53
Ext Interrupts
53
Usb Transceiver
1
Usb Speed
Full Speed
Usb Interface
Device
Spi
3
Twi (i2c)
1
Uart
2
Segment Lcd
160
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
2000
Analog Comparators
4
Resistive Touch Screen
No
Temp. Sensor
Yes
Crypto Engine
AES/DES
Sram (kbytes)
8
Eeprom (bytes)
2048
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
Yes
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.6 to 3.6
Operating Voltage (vcc)
1.6 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
3
Output Compare Channels
10
Input Capture Channels
10
Pwm Channels
10
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes

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29.8
29.9
29.10 CRC Functionality
29.11 Self-programming and Boot Loader Support
29.11.1
8291A–AVR–10/11
Protection of NVM
Preventing NVM Corruption
Flash Programming
Alternative 1:
Alternative 2:
To protect the flash and EEPROM memories from write and/or read, lock bits can be set to
restrict access from external programmers and the application software. Refer to
Lock Bit register” on page 30
During periods when the V
result from a flash memory write can be corrupt, as supply voltage is too low for the CPU and
the flash to operate properly.To ensure that the voltage is sufficient enough during a complete
programming sequence of the flash memory, a voltage detector using the POR threshold
(V
(BOD) is automatically enabled at its configured level.
Depending on the programming operation, if any of these Vcc voltage levels are reached, the
programming sequence will be aborted immediately. If this happens, the NVM programming
should be restarted when the power is sufficient again, in case the write sequence failed or only
partly succeeded.
It is possible to run an automatic cyclic redundancy check (CRC) on the flash program memory.
When NVM is used to control the CRC module, an even number of bytes are read, at least in the
flash range mode. If the user selects a range with an odd number of bytes, an extra byte will be
read, and the checksum will not correspond to the selected range.
Refer to
Reading and writing the EEPROM and flash memory from the application software in the device
is referred to as self-programming. A boot loader (application code located in the boot loader
section of the flash) can both read and write the flash program memory, user signature row, and
EEPROM, and write the lock bits to a more secure setting. Application code in the application
section can read from the flash, user signature row, calibration row, and fuses, and read and
write the EEPROM.
The boot loader support provides a real read-while-write self-programming mechanism for
uploading new program code by the device itself. This feature allows flexible application soft-
ware updates controlled by the device using a boot loader application that reside in the boot
loader section in the flash. The boot loader can use any available communication interface and
associated protocol to read code and write (program) that code into the flash memory, or read
• Fill the EEPROM page buffer with the selected number of bytes
• Perform a EEPROM page erase
• Perform a EEPROM page write
• Fill the EEPROM page buffer with the selected number of bytes
• Perform an atomic EEPROM page erase and write
POT+
) level is enabled. During chip erase and when the PDI is enabled the brownout detector
”CRC - Cyclic Redundancy Check” on page 326
CC
for details on the available lock bit settings and how to use them.
voltage is below the minimum operating voltage for the device, the
Atmel AVR XMEGA B
for more details.
”LOCKBITS –
387

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