ALXD800EEXJ2VD AMD (ADVANCED MICRO DEVICES), ALXD800EEXJ2VD Datasheet - Page 595

• Manufacturer Part Number: ALXD800EEXJ2VD
• Manufacturer: AMD (ADVANCED MICRO DEVICES)

Specifications of ALXD800EEXJ2VD

• Operating Temperature (min): 0C
• Operating Temperature (max): 85C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Lead Free Status / RoHS Status: Compliant

Electrical Specifications
This section provides information on electrical connections,
absolute maximum ratings, operating conditions, and
DC/AC characteristics for the AMD Geode™ LX processor.
All voltage values in the electrical specifications are with
respect to V
7.1
7.1.1
Testing and operating the Geode LX processor requires the
use of standard high frequency techniques to reduce para-
sitic effects. When using this device, the effects can be
minimized by filtering the DC power leads with low-induc-
tance decoupling capacitors, using low-impedance wiring,
and by connecting all V
to the appropriate voltage levels.
7.1.2
Balls designated as NC (No Connection) should be left dis-
connected. Connecting an NC ball to a pull-up/-down resis-
tor, or an active signal could cause unexpected results and
possible circuit malfunctions.
AMD Geode™ LX Processors Data Book
Symbol
T
V
V
V
V
STORAGE
CORE
IO
MEM
MAX
Electrical Connections
PWR/GND Connections and Decoupling
NC-Designated Balls
SS
unless otherwise noted.
Parameter
Storage Temperature
Core Supply Voltage
I/O Supply Voltage
Memory Voltage
Voltage On Any Pin
Voltage on HSYNC, VSYNC
ESD - Human Body Model
ESD - Machine Model
CORE,
V
IO
, V
MEM
Table 7-1. Absolute Maximum Ratings
, and analog balls
7.0Electrical Specifications
Min
-0.5
-0.5
-65
3.0
7.1.3
All inputs not used by the system designer should be kept
at either ground or V
tion.
(±10%) pull-down resistor and active-low inputs to V
through a 20-kΩ (±10%) pull-up resistor can be used if
desired.
7.2
Table 7-1 lists absolute maximum ratings for the Geode LX
processor. Stresses beyond the listed ratings may cause per-
manent damage to the device. Exposure to conditions beyond
these limits may (1) reduce device reliability and (2) result in
premature failure even when there is no immediately appar-
ent sign of failure. Prolonged exposure to conditions at or
near the absolute maximum ratings may also result in
reduced useful life and reliability. These are stress ratings
only and do not imply that operation under any conditions
other than those listed in Table 7-2 "Operating Conditions"
on page 596 is possible.
For active-high inputs to ground through a 20-kΩ
2000
Max
150
200
1.4
3.6
3.6
3.8
5.5
Unused Inputs
Absolute Maximum Ratings
IO
Unit
. To prevent possible spurious opera-
°C
V
V
V
V
V
V
V
33234C
Comments
No Bias
Also applies to V
V
Except HSYNC, VSYNC
VA
, and V
7
DAC
CA
, V
MA
595
,
IO