UPD78F1152AGC-GAD-AX Renesas Electronics America, UPD78F1152AGC-GAD-AX Datasheet - Page 900

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UPD78F1152AGC-GAD-AX

Manufacturer Part Number
UPD78F1152AGC-GAD-AX
Description
MCU 16BIT 78K0R/KX3 80-LQFP
Manufacturer
Renesas Electronics America
Series
78K0R/Kx3r
Datasheet

Specifications of UPD78F1152AGC-GAD-AX

Core Processor
78K/0R
Core Size
16-Bit
Speed
20MHz
Connectivity
3-Wire SIO, I²C, LIN, UART/USART
Peripherals
DMA, LVD, POR, PWM, WDT
Number Of I /o
65
Program Memory Size
64KB (64K x 8)
Program Memory Type
FLASH
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 8x10b, D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
UPD78F1152AGC-GAD-AX
Manufacturer:
Renesas Electronics America
Quantity:
10 000
898
5th edition
Edition
Addition of 26.3 Securing of user resources
Addition of addr5 to Table 27-2. Symbols in “Operation” Column
Change of operation of CALLT in Table 27-5. Operation List (15/17)
Change of description in (4)
Change of Figure 19-2. Timing of Reset by RESET Input
Change of Figure 19-4. Timing of Reset in STOP Mode by RESET Input
Change of 24.4.1 FLMD0 pin
Change of Remark in 24.8 Flash Memory Programming by Self-Programming
Change of Figure 24-10. Flow of Self Programming (Rewriting Flash Memory),
and addition of Remark
Absolute Maximum Ratings
• Change of Input voltage
Change of Notes 1 in Internal Oscillator Characteristics
DC Characteristics
• Change of condition of Output current, high (I
• Change of condition of Output current, low (I
• Change of condition of Input voltage, high (V
• Change of condition of Input voltage, high (V
• Change of condition of Input voltage, low (V
• Change of condition of Input voltage, low (V
• Change of Cautions 2
• Change of Output voltage, high (V
• Change of Output voltage, low (V
• Change of condition of Input leakage current, high (I
• Change of condition of Input leakage current, high (I
• Change of condition of Input leakage current, low (I
• Change of condition of Input leakage current, low (I
• Change of Supply current (I
Notes 4, and
• Change of Supply current (I
Notes 4, and
AC Characteristics
(1) Basic operation
• Addition of figures of Minimum instruction execution time during main system
• Change of title in AC Timing Test Points
Modification of condition in upper part of table
Change of figures and figure title in Supply Voltage Rise Time Timing
Change of specifications of
78F1156 from target specifications to formal specifications
• Change of Output voltage
• Change of rating of Analog output voltage (V
clock operation and Minimum instruction execution time during self
programming mode in (1) Basic operation
Remarks 3.
Remarks 3.
μ
PD78F1152, 78F1153, 78F1154, 78F1155, and
DD1
DD2
APPENDIX C REVISION HISTORY
) and addition of low consumption current mode,
) and addition of low consumption current mode,
User’s Manual U17893EJ8V0UD
OL2
OH2
Description
)
)
IL4
IL5
OL2
AO
IH4
IH5
OH2
)
)
)
)
)
)
)
LIL2
LIL3
LIH2
LIH3
)
)
)
)
CHAPTER 26 BCD
CORRECTION CIRCUIT
CHAPTER 27
INSTRUCTION SET
CHAPTER 19 RESET
FUNCTION
CHAPTER 24 FLASH
MEMORY
CHAPTER 28
ELECTRICAL
SPECIFICATIONS
Chapter
(14/20)

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