CS5535-UDCF AMD (ADVANCED MICRO DEVICES), CS5535-UDCF Datasheet - Page 196

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CS5535-UDCF

Manufacturer Part Number
CS5535-UDCF
Description
Manufacturer
AMD (ADVANCED MICRO DEVICES)
Datasheet

Specifications of CS5535-UDCF

Operating Temperature (min)
0C
Operating Temperature (max)
85C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Lead Free Status / RoHS Status
Compliant

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5.20.1
The EXTEST instruction accesses the boundary scan
chain around the chip and controls the pad logic such that
the boundary scan data will control the data and enable
signals for the pads. IEEE 1149.1 requires that an all-zero
instruction access the boundary scan chain.
5.20.2
These instructions enable JTAG access to the internal
scan associated with a particular CCU clock. TCK will then
provide the Scan clock to the CCU so that shifting occurs
correctly during the Shift-DR state of the TAP. (See Figure
5-64 and Figure 5-65.)
196
Pad
Pad
EXTEST
TAPSCAN
Test Mode = 1
Scan In
31506B
Scan In
Figure 5-64. TAP Controller and Parallel Scan Mode
GeodeLink™ Device
TAP
5.20.3
These instructions connect TDI and TDO to the 1-bit
bypass register during DR access. They are useful in that
during the Capture-DR state, one functional clock can be
applied to the specific CCU clock indicated by the instruc-
tion. This mode works well with the FS2 JTAG control soft-
ware available with Geode CS5535 companion device.
The Scan Enable signal to the block will be inactive during
this clock.
AMD Geode™ CS5535 Companion Device Data Book
TAPFUNC
Scan Out
TAP Controller
Pad

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