MM912H634DM1AER2 Freescale Semiconductor, MM912H634DM1AER2 Datasheet - Page 29

• Manufacturer Part Number: MM912H634DM1AER2
• Description: 16-bit Microcontrollers - MCU 64KS12 LIN2XLS/HS ISENSE
• Manufacturer: Freescale Semiconductor

Specifications of MM912H634DM1AER2

• Rohs: yes
• Core: HCS12
• Processor Series: MM912F634
• Data Bus Width: 16 bit
• Maximum Clock Frequency: 20 MHz
• Program Memory Size: 32 KB
• Data Ram Size: 2 KB
• On-chip Adc: Yes
• Operating Supply Voltage: 5.5 V to 18 V
• Operating Temperature Range: - 40 C to + 105 C
• Package / Case: LQFP-48
• Mounting Style: SMD/SMT
• A/d Bit Size: 10 bit
• A/d Channels Available: 15
• Interface Type: SPI
• Maximum Operating Temperature: + 105 C
• Minimum Operating Temperature: - 40 C
• Number Of Programmable I/os: 15
• Number Of Timers: 1
• Program Memory Type: Flash
• Supply Voltage - Max: 18 V
• Supply Voltage - Min: 5.5 V

Table 38. NVM Reliability Characteristics
Data retention after 10,000 program/erase cycles for T
Data retention with <100 program/erase cycles for T
Number of program/erase cycles
(-40 C  T
Number of program/erase cycles
(0 C  T
Note:
Electrical Characteristics
3.6.2.2
The reliability of the NVM blocks is guaranteed by stress tests during qualification, constant process monitors, and burn-in to
screen early life failures. The program/erase cycle count on the sector is incremented every time a sector or mass erase event
is executed.
Freescale Semiconductor
41.
42.
43.
44.
T
T
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to 25 °C, using
Spec table quotes typical endurance evaluated at 25 °C for this product family, typical endurance at various temperature can be estimated
the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, refer to Engineering Bulletin EB618.
using the graph in
JAVG
JAVG
J
 140 C)
J
 0 C)
is the Average Junction Temperature
will not exceed 85 °C considering a typical temperature profile over the lifetime of a consumer, industrial, or automotive application.
NVM Reliability
300
250
200
150
100
50
0
Figure
-40
10. For additional information on how Freescale defines Typical Endurance, refer to Engineering Bulletin EB619.
(42)
(42)
Rating
Figure 10. Typical Flash Cycling Endurance vs. Temperature
-20
0
JAVG
JAVG
20
 85 C
85 C
Operating Temperature T
(41)
(41)
40
,
(42)
,
(42)
60
Symbol
t
FLRET
n
FL
J
80
[C]
10,000
10,000
Min
15
20
100
Dynamic Electrical Characteristics
100,000
100
100
120
Typ
-
(43)
(43)
(44)
140
Max
-
-
-
-
MM912F634
Cycles
Years
Unit
29